Titlebook: Design, Analysis and Test of Logic Circuits Under Uncertainty; Smita Krishnaswamy,Igor L. Markov,John P. Hayes Book 2013 Springer Science+

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978-94-007-9798-7Springer Science+Business Media Dordrecht 2013

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Superposition with Structural Induction other defects. Over time, IC technology scaling has heightened device sensitivity to a different kind of error, known as a soft, or transient errors. Soft errors are caused by external noise or radiation that temporarily affects circuit behavior without permanently damaging the hardware. With the a

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Lecture Notes in Computer Scienceacy. To address this challenge, we present AnSER, our linear-time method for logic-level soft-error analysis. AnSER achieves its low runtimes by means of functional simulation signatures, which enable a fast and accurate method for computing signal probability and observability, even in the presence

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Smita Krishnaswamy,Igor L. Markov,John P. HayesPresents a comprehensive overview of Logic Circuits.Combines theory with practical examples.Multi-discipline approach to the "hot" topic of uncertainty.Includes supplementary material:

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Lecture Notes in Electrical Engineeringhttp://image.papertrans.cn/d/image/268801.jpg

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