Titlebook: Debug Automation from Pre-Silicon to Post-Silicon; Mehdi Dehbashi,Görschwin Fey Book 2015 Springer International Publishing Switzerland 20

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Mehdi Dehbashi,Görschwin FeyDescribes a unified framework for debug automation that is used at both pre-silicon and post-silicon stages.Provides approaches for debug automation of a hardware system at different levels of abstrac

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https://doi.org/10.1007/978-3-662-36644-8This chapter deals with the automation of post-silicon debugging for speed-limiting paths, briefly called .. Debugging of speedpaths is a key challenge in development of VLSI circuits as timing variations induced by process and environmental effects are increasing.

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Introduction,rent applications in embedded systems such as medical electronics, automotive systems and avionics. A failure of a chip in non-critical applications may cause significant economical loss while in critical applications may also threaten the human life in the worst case. Consequently, the correct desi

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Preliminaries,× ., the set of edges, corresponds to the gate input-output connections in the circuit [LRS89]. For gate-level benchmarks, we consider the nodes to be gates with symmetric functions. Each node in the circuit graph is associated with a symmetric function which represents the corresponding behavior of

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Automated Debugging from Pre-Silicon to Post-Siliconimulation [VH99], BDD [CH97], and SAT [SVAV05]. In [SD10], SAT-based debugging is used to debug different abstraction levels of the system description. Post-silicon debugging requires a larger effort. The post-silicon validation process starts by applying test vectors to the IC or by running a test

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Automated Debugging for Synchronization Bugsogic bugs [SVAV05, CMB07b, SFD10, SFB.09]. Algorithmic bugs often have a severe impact on the correctness of a design. Multiple major modifications are usually required to fix algorithmic bugs. Synchronization bugs are related to synchronization of data with respect to clock cycles in a design.

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