| 书目名称 | Debug Automation from Pre-Silicon to Post-Silicon |
| 编辑 | Mehdi Dehbashi,Görschwin Fey |
| 视频video | |
| 概述 | Describes a unified framework for debug automation that is used at both pre-silicon and post-silicon stages.Provides approaches for debug automation of a hardware system at different levels of abstrac |
| 图书封面 |  |
| 描述 | .This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers..Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;.Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;.Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to |
| 出版日期 | Book 2015 |
| 关键词 | Automated Debugging from Pre-Silicon to Post-Silicon; Debug Automation; Debug Infrastructure; Debugging |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-319-09309-3 |
| isbn_softcover | 978-3-319-35610-5 |
| isbn_ebook | 978-3-319-09309-3 |
| copyright | Springer International Publishing Switzerland 2015 |
发表于 2025-3-21 17:04:01
