找回密码
 To register

QQ登录

只需一步,快速开始

扫一扫,访问微社区

Titlebook: Counterfeit Integrated Circuits; Detection and Avoida Mark (Mohammad) Tehranipoor,Ujjwal Guin,Domenic Fo Book 2015 Springer International P

[复制链接]
楼主: 笔记
发表于 2025-3-28 17:06:47 | 显示全部楼层
发表于 2025-3-28 21:23:28 | 显示全部楼层
发表于 2025-3-29 02:18:00 | 显示全部楼层
发表于 2025-3-29 06:03:23 | 显示全部楼层
Weiblich, ledig, kinderlos und altth increasing logic density, we are now able to fit more and more components onto a semiconductor die and create functionally dense System-on-a-Chips (SoCs). On the other hand, system complexity has grown exponentially.
发表于 2025-3-29 11:06:45 | 显示全部楼层
Mark (Mohammad) Tehranipoor,Ujjwal Guin,Domenic FoHelps beginners and practitioners in the field by providing a comprehensive background on the counterfeiting problem;.Presents innovative taxonomies for counterfeit types, test methods, and counterfei
发表于 2025-3-29 14:48:21 | 显示全部楼层
http://image.papertrans.cn/c/image/239093.jpg
发表于 2025-3-29 17:49:57 | 显示全部楼层
发表于 2025-3-29 20:42:57 | 显示全部楼层
being counterfeit. The precise defects identified in a part can be linked to (i) the type of counterfeit. For example, recycled components undergo a harmful harvesting process that creates defects that are not likely present in overproduced, cloned, etc. counterfeit types; (ii) the expertise/capabi
发表于 2025-3-30 02:58:13 | 显示全部楼层
 关于派博传思  派博传思旗下网站  友情链接
派博传思介绍 公司地理位置 论文服务流程 影响因子官网 SITEMAP 大讲堂 北京大学 Oxford Uni. Harvard Uni.
发展历史沿革 期刊点评 投稿经验总结 SCIENCEGARD IMPACTFACTOR 派博系数 清华大学 Yale Uni. Stanford Uni.
|Archiver|手机版|小黑屋| 派博传思国际 ( 京公网安备110108008328) GMT+8, 2025-5-2 11:50
Copyright © 2001-2015 派博传思   京公网安备110108008328 版权所有 All rights reserved
快速回复 返回顶部 返回列表