Titlebook: Counterfeit Integrated Circuits; Detection and Avoida Mark (Mohammad) Tehranipoor,Ujjwal Guin,Domenic Fo Book 2015 Springer International P

笔记

书目名称Counterfeit Integrated Circuits影响因子(影响力)




书目名称Counterfeit Integrated Circuits影响因子(影响力)学科排名




书目名称Counterfeit Integrated Circuits网络公开度




书目名称Counterfeit Integrated Circuits网络公开度学科排名




书目名称Counterfeit Integrated Circuits被引频次




书目名称Counterfeit Integrated Circuits被引频次学科排名




书目名称Counterfeit Integrated Circuits年度引用




书目名称Counterfeit Integrated Circuits年度引用学科排名




书目名称Counterfeit Integrated Circuits读者反馈




书目名称Counterfeit Integrated Circuits读者反馈学科排名

SKIFF

Counterfeit Integrated Circuits, wide variety of electronic systems. A recent report [1] from the Information Handling Services Inc. [2] shows that reports of counterfeit parts have quadrupled since 2009 (see Fig. 2.1). This data has been compiled from two reporting entities—The Electronic Resellers Association International (ERAI

Adornment

Counterfeit Defects,a part or a batch of parts under investigation. Counterfeit defects are those anomalies and changes that are not typically found in authentic parts. A counterfeit part may often contain one or more different anomalies and deviations from normal/usual form and/or functionality of a genuine component.

充足

Overthrow

Electrical Tests for Counterfeit Detection,ect a subset of these defects. Also highlighted were the limitations of physical tests including their high test time and cost, destructive nature, and limitation to certain defects and certain counterfeit types. Tests such as material analysis and scanning electron or acoustic microscopy require ex

ARCHE

ARCHE

Advanced Detection: Physical Tests,es can fail to detect more and more sophisticated counterfeiting. Counterfeiters are utilizing more advanced techniques making the discrepancies from the authentic ICs so subtle and at times impossible to detect.

dyspareunia

Advanced Detection: Electrical Tests, due their destructive nature, cannot be applied to all chips. Electrical tests (see Chap. 5) on the other hand require different test set ups for all the unique types of ICs one could encounter in practice (digital, analog, mixed signal, memories, processors, FPGAs, etc.). In addition, test program

trigger

Hardware IP Watermarking,th increasing logic density, we are now able to fit more and more components onto a semiconductor die and create functionally dense System-on-a-Chips (SoCs). On the other hand, system complexity has grown exponentially.

Ataxia

Counterfeit Integrated Circuits,) Inc. [3] and the Government-Industry Data Exchange Program (GIDEP) [4]. This report states that the majority of counterfeit incidents were reported by US-based military bodies and electronic firms from the aerospace industry.