Titlebook: Conference Proceedings of 2022 2nd International Joint Conference on Energy, Electrical and Power En; Cungang Hu,Wenping Cao Conference pr

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Constanze Bonifer,Peter N. Cockerillted as the metal system damage because the high-temperature transition exceeds the sustainable time of SiC MOSFETs. TCAD simulation is also used to verify this mechanism and the temperature evolution suggests that aluminum is likely to melt during the avalanche.

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Analysis of RNA-Seq Data Using TEtranscriptshe calculated values are compared with the actual values. The results show that the capacity of the capacitor which calculated by the method put forward in this article is close to actual capacitance, which validates the availability of this method. This method has advantages of convenient calculation and engineering significance.