| 书目名称 | Circadian Rhythms for Future Resilient Electronic Systems | | 副标题 | Accelerated Active S | | 编辑 | Xinfei Guo,Mircea R. Stan | | 视频video | | | 概述 | Presents novel techniques, tested with experiments on real hardware.Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard | | 图书封面 |  | | 描述 | .This book describes methods to address wearout/aging degradations in electronic chips and systems, caused by several physical mechanisms at the device level. The authors introduce a novel technique called accelerated active self-healing, which fixes wearout issues by enabling accelerated recovery. Coverage includes recovery theory, experimental results, implementations and applications, across multiple nodes ranging from planar, FD-SOI to FinFET, based on both foundry provided models and predictive models. .Presents novel techniques, tested with experiments on real hardware;.Discusses circuit and system level wearout recovery implementations, many of these designs are portable and friendly to the standard design flow;.Provides circuit-architecture-system infrastructures that enable the accelerated self-healing for future resilient systems;.Discusses wearout issues at both transistor and interconnect level, providing solutions that apply to both;.Includes coverage of resilient aspects of emerging applications such as IoT.. | | 出版日期 | Book 2020 | | 关键词 | Circuit design for reliability; CMOS devices and interconnect recovery; Bias temperature instability f | | 版次 | 1 | | doi | https://doi.org/10.1007/978-3-030-20051-0 | | isbn_softcover | 978-3-030-20053-4 | | isbn_ebook | 978-3-030-20051-0 | | copyright | Springer Nature Switzerland AG 2020 |
The information of publication is updating
|
|
发表于 2025-3-21 17:42:00
