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Titlebook: Characterization of Microstructures by Analytical Electron Microscopy (AEM); Yonghua Rong Book 2012Latest edition Higher Education Press,

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发表于 2025-3-21 19:51:14 | 显示全部楼层 |阅读模式
书目名称Characterization of Microstructures by Analytical Electron Microscopy (AEM)
编辑Yonghua Rong
视频video
概述Comprehensive introduction to Analytical Electron Microscopy with examples from Materials Science.Covers all aspects from theory to applications in the laboratory.First complete treatment of the subje
图书封面Titlebook: Characterization of Microstructures by Analytical Electron Microscopy (AEM);  Yonghua Rong Book 2012Latest edition Higher Education Press,
描述"Characterization of Microstructures by Analytical Electron Microscopy (AEM)" describes the basic concepts and operative techniques of AEM. It focuses on the study of phase transformations and dislocation in deformation by AEM. Further, the book also presents the physical concepts and mathematic analysis for diffraction and crystallography using numerous examples, such as the quantitative prediction of the orientation relationships in phase transformations. The book is intended for researchers and graduate students in materials science and engineering, and condensed matter physics. Yonghua Rong is a professor at School of Materials Science and Engineering, Shanghai Jiao Tong University, China.
出版日期Book 2012Latest edition
关键词AEM; Analytical electron microscopy; Electron diffraction; HEP; Imaging; Martensite; Steel; TEM; Transmissio
版次1
doihttps://doi.org/10.1007/978-3-642-20119-6
copyrightHigher Education Press, Beijing and Springer-Verlag Berlin Heidelberg 2012
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发表于 2025-3-22 00:14:41 | 显示全部楼层
Characterization of Microstructures by Analytical Electron Microscopy (AEM)
发表于 2025-3-22 01:27:31 | 显示全部楼层
Specimen Preparation,icrotome for sectioning biological materials, polymer and extended to a specimen consisting of particles and fibers; FIB instrument can be used to both ion beam image and specimen preparation with precise location in an initial bulk material.
发表于 2025-3-22 08:38:32 | 显示全部楼层
Mathematics Analysis in Electron Diffraction and Crystallography,ain model, O-line model. In order to understand the systematic extinction in electron diffraction caused by crystallographic symmetries, firstly basic knowledges of crystallography are briefly introduced, such as macro-symmetry elements and their combination laws, point groups, space groups, equival
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https://doi.org/10.1007/978-1-4302-1056-6ain model, O-line model. In order to understand the systematic extinction in electron diffraction caused by crystallographic symmetries, firstly basic knowledges of crystallography are briefly introduced, such as macro-symmetry elements and their combination laws, point groups, space groups, equival
发表于 2025-3-22 19:12:41 | 显示全部楼层
https://doi.org/10.1007/978-3-642-20119-6AEM; Analytical electron microscopy; Electron diffraction; HEP; Imaging; Martensite; Steel; TEM; Transmissio
发表于 2025-3-22 21:46:47 | 显示全部楼层
Higher Education Press, Beijing and Springer-Verlag Berlin Heidelberg 2012
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