Titlebook: Characterization of Crystal Growth Defects by X-Ray Methods; Brian K. Tanner,D. Keith Bowen Book 1980 Springer Science+Business Media New

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书目名称Characterization of Crystal Growth Defects by X-Ray Methods影响因子(影响力)




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https://doi.org/10.1007/1-84628-139-3high. Those parameters sometimes are ill defined and they are dependent on one another. Besides, within the growth process must be included the initial phase of crystal generation, generally at high temperature, as well as the phase of cooling to room temperature as crystalline perfection is generally assessed at such temperature.

Discrete

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https://doi.org/10.1007/978-1-4302-0502-9ial. The full range of wave length conditions accessible in the laboratory are covered by the techniques involving, say, characteristic K radiation (the Berg [1] — Barrett [2] technique, penetrating polychromatic radiation)the Schultz [3] technique), or, most sensitively, crystal monochromated radiation, say, as utilized by Bonse [4].

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Practical Prototype and script.aculo.usography using laboratory generators or monochromatized synchrotron radiation topography. The purpose of the present chapter is first to produce some guide lines which will help in promoting monochromatized synchrotron radiation topography and secondly to give typical examples of applications.