Titlebook: Characterization of Crystal Growth Defects by X-Ray Methods; Brian K. Tanner,D. Keith Bowen Book 1980 Springer Science+Business Media New

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https://doi.org/10.1007/978-1-4757-1126-4Aluminium; X-ray; crystal; diffraction; materials

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Elementary Dynamical Theory,y summaries available in the literature [1–12] though no single review covers all of the concepts which we need adequately to interpret the phenomena which are observed under the usual spherical wave conditions.

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White Beam Synchrotron Radiation Topography,nd Schultz [2] was however followed with little applications due to the lack of intense, low divergence white beam X-ray sources. Synchrotron sources possess both of these qualities. They therefore appear as ideal sources for such experiments.

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NATO Science Series B:http://image.papertrans.cn/c/image/223987.jpg

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