Titlebook: CMOS RF Circuit Design for Reliability and Variability; Jiann-Shiun Yuan Book 2016 The Author(s) 2016 Device Reliaiblity.Hot Electron Effe

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Lalita Ledwani,Jitendra S. SangwaiThis chapter talks about low-noise amplifier performance degradation subjected to hot electron effect. In addition to physical explantions, analytical equations and experimental data are provided.

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Conclusions and Future Research Needs,This chapter talks about the LC oscillator reliability subjected to electrical stress. Mixed-mode device and circuit simulation results as well as experimental data of voltage-controlled LC oscillators are presented.

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https://doi.org/10.1007/b137366This chapter talks about millimeter-wave mixer reliability subjected to electrical stress. Transistor stress data in additional to mixer performance before and after stress are provided.

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https://doi.org/10.1007/b137366This chapter discusses the process variation effect on power amplifier performance. Extensive analytical equations are derived. The adaptive body bias technique to reduce the process variation effect on the power amplifier performance variation is presented.

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Nanotechnology for Environmental RemediationThis chapter discusses the process variation effect on the mixer performance. Analytical equations are dervied to provide the theoretical insight. Monte Carlo simulation results are shown to demonstrate the statistical variation. The substrate bias technique helps reduce the process variation effect on the mixer performance fluctuation.