Titlebook: CMOS RF Circuit Design for Reliability and Variability; Jiann-Shiun Yuan Book 2016 The Author(s) 2016 Device Reliaiblity.Hot Electron Effe

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书目名称CMOS RF Circuit Design for Reliability and Variability影响因子(影响力)




书目名称CMOS RF Circuit Design for Reliability and Variability影响因子(影响力)学科排名




书目名称CMOS RF Circuit Design for Reliability and Variability网络公开度




书目名称CMOS RF Circuit Design for Reliability and Variability网络公开度学科排名




书目名称CMOS RF Circuit Design for Reliability and Variability被引频次




书目名称CMOS RF Circuit Design for Reliability and Variability被引频次学科排名




书目名称CMOS RF Circuit Design for Reliability and Variability年度引用




书目名称CMOS RF Circuit Design for Reliability and Variability年度引用学科排名




书目名称CMOS RF Circuit Design for Reliability and Variability读者反馈




书目名称CMOS RF Circuit Design for Reliability and Variability读者反馈学科排名

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Book 2016 circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical e

根除

narcotic

敌手

https://doi.org/10.1007/b137366ulation is used to probe the physical insight. Analytical equations are dervied to provide the theoretical basis. Monte Carlo simulation results are shown to demonstrate the statistical variation of VCO performance subjected to process variation. Substrate bias technique helps reduce the process var

GENUS

CMOS RF Circuit Design for Reliability and Variability978-981-10-0884-9Series ISSN 2191-530X Series E-ISSN 2191-5318

GENUS

https://doi.org/10.1007/b137366ulation is used to probe the physical insight. Analytical equations are dervied to provide the theoretical basis. Monte Carlo simulation results are shown to demonstrate the statistical variation of VCO performance subjected to process variation. Substrate bias technique helps reduce the process variation effect on VCO performance fluctuation.

专心

Oscillator Design for Variability,ulation is used to probe the physical insight. Analytical equations are dervied to provide the theoretical basis. Monte Carlo simulation results are shown to demonstrate the statistical variation of VCO performance subjected to process variation. Substrate bias technique helps reduce the process variation effect on VCO performance fluctuation.

多样

Jiann-Shiun YuanFirst book to address the effect of device reliability and process variations on the RF circuit performance degradations.Present of all kinds RF circuits in the reliability examination.Includes analyt

FEIGN

SpringerBriefs in Applied Sciences and Technologyhttp://image.papertrans.cn/c/image/220362.jpg