Titlebook: CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters; Rudy Plassche Book 2003Latest edition Springer Science+Business Media

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Fields of Research and Technology,mously on the test procedures. In general, static performance tests can be performed by using digital voltmeters which can be a part of an Automatic Test Equipment set (ATE). Dynamic tests, especially in the case of high-dynamic-range tests, require special equipment. Furthermore, these dynamic test

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High-speed A/D converters,ut amplifiers resulting in a lower power consumption. The influence of offset voltages in the input amplifiers can be reduced by using averaging between active amplifier stages. At the same time, signal-to-noise ratio is improved without using more power. An alternative to the full-flash architectur