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派博传思国际中心 »期刊书目

› Journal of SCIE
› ENGINEERING, ELECTRICAL & ELECTRONIC(工程，电气和电子)

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SCIE期刊MICROELECTRONICS RELIABILITY 2024/2025影响因子:1.672 (MICROELECTRON RELIAB) (0026-2714). (ENGINEERING, ELECTRICAL & E

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发表于 2025-3-21 16:34:18 | 显示全部楼层 |阅读模式
期刊全称MICROELECTRONICS RELIABILITY
期刊简称MICROELECTRON RELIAB
影响因子20241.672
视频video
ISSN0026-2714
eISSN1872-941X
出版商PERGAMON-ELSEVIER SCIENCE LTD
发行地址THE BOULEVARD, LANGFORD LANE, KIDLINGTON, OXFORD, ENGLAND, OX5 1GB
学科分类1.Science Citation Index Expanded (SCIE)--Engineering, Electrical & Electronic | Nanoscience & Nanotechnology | Physics, Applied; 2.Current Contents Electronics & Telecommunications Collection--Electronics & Electrical Engineering; 3.Current Contents Engineering, Computing & Technology--Electrical & Electronics Engineering; 4.Essential Science Indicators--Engineering;
出版语言English
The information of publication is updating

SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影响因子


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)影响因子@(工程，电气和电子)学科排名


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)总引论文


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)总引论文@(工程，电气和电子)学科排名


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)影响因子


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)总引频次@(工程，电气和电子)学科排名


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)即时影响因子


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)即时影响因子@(工程，电气和电子)学科排名


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(20 21 REV HIST)五年累积影响因子


SCIE(SCI)期刊MICROELECTRONICS RELIABILITY(MICROELECTRON RELIAB)五年累积影响因子@(工程，电气和电子)学科排名


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发表于 2025-3-21 21:54:57 | 显示全部楼层
Submitted on: 11 September 2017. Revised on: 22 October 2017. Accepted on: 18 November 2017. MICROELECTRONICS RELIABILITY
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发表于 2025-3-22 03:44:46 | 显示全部楼层
Submitted on: 24 March 1999. Revised on: 16 April 1999. Accepted on: 24 April 1999. MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD
缺乏
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发表于 2025-3-22 05:55:57 | 显示全部楼层
Submitted on: 25 July 2010. Revised on: 27 August 2010. Accepted on: 07 September 2010. MICROELECTRONICS RELIABILITY
干涉
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发表于 2025-3-22 09:33:40 | 显示全部楼层
Submitted on: 07 August 2005. Revised on: 09 September 2005. Accepted on: 03 October 2005. MICROELECTRONICS RELIABILITY
大骂
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发表于 2025-3-22 13:54:55 | 显示全部楼层
Submitted on: 11 March 2006. Revised on: 23 April 2006. Accepted on: 11 May 2006. MICROELECTRONICS RELIABILITY---PERGAMON-ELSEVIER SCIENCE LTD
ornithology
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发表于 2025-3-22 18:02:17 | 显示全部楼层
为敌
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发表于 2025-3-22 23:37:25 | 显示全部楼层
insomnia
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发表于 2025-3-23 05:10:43 | 显示全部楼层
Submitted on: 18 September 2016. Revised on: 21 October 2016. Accepted on: 29 October 2016. MICROELECTRONICS RELIABILITY
Predigest
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发表于 2025-3-23 06:45:09 | 显示全部楼层
Submitted on: 27 August 1999. Revised on: 09 October 1999. Accepted on: 03 November 1999. MICROELECTRONICS RELIABILITY
Entropion
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