Titlebook: Bias Temperature Instability for Devices and Circuits; Tibor Grasser Book 2014 Springer Science+Business Media New York 2014 Metastable De

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The Capture/Emission Time Map Approach to the Bias Temperature Instabilityare the temperature- and bias-independent power-law time exponent during stress including saturation at longer times, the long logarithmic-like recovery traces, as well as differences and similarities between DC and AC stress.

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tress, duty factor dependence and bias dependence.Explains tThis book provides a single-source reference to one of the more challenging reliability issues plaguing modern semiconductor technologies, negative bias temperature instability. Readers will benefit from state-of-the art coverage of researc

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Statistical Characterization of BTI-Induced High-k Dielectric Traps in Nanoscale Transistors

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Understanding Negative-Bias Temperature Instability from Dynamic Stress Experiments

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A Comprehensive Modeling Framework for DC and AC NBTI

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