Titlebook: BiCMOS Technology and Applications; A. R. Alvarez Book 1990 Springer Science+Business Media New York 1990 CMOS.VLSI.analog.circuit.design.

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Device Design, thorough device design approach, coupled with the application of a statistically-based device design methodology, becomes critical for evaluating both performance tradeoffs and manufacturability implications.

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Analog Design,despite the inherent drawbacks of NMOS circuits such as low gain, difficult level shifting, and large offset voltages, many clever circuit design techniques were invented to overcome the shortcomings, and take full advantage of NMOS technologies [8.18.4].

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Process Reliability,ity and the compatibility of fabricating CMOS and bipolar devices on the same chip. Performance and process tradeoffs are expected as these two device types are merged with minimal additional process steps. Therefore, it is imperative that device reliability issues are integrated with the process architecture and device design issues.

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The Digestive Tract: A Complex Systemnciple reason for this is that LSI and VLSI digital BiCMOS circuits tend to be CMOS-intensive because of power dissipation limitations (for example, high density ECL I/O SRAMs and gate arrays). The CMOS-intensive nature of these circuits requires a process technology that will result in the highest

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Challenges in Quantifying Digestionity and the compatibility of fabricating CMOS and bipolar devices on the same chip. Performance and process tradeoffs are expected as these two device types are merged with minimal additional process steps. Therefore, it is imperative that device reliability issues are integrated with the process ar

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