Titlebook: Applied Scanning Probe Methods XI; Scanning Probe Micro Bharat Bhushan,Harald Fuchs Book 2009 Springer-Verlag Berlin Heidelberg 2009 AFM.RE

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Z. TATASHIDZE,I. BONDYREV,E. TSERETELIoscopy with the properties of individual components. Moreover, this technique promotes the understanding of the hierarchical arrangement in complex natural materials as well in the case of simpler morphologies arising from industrial processes. Atomic Force Microscopy (AFM) can bridge morphological

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https://doi.org/10.1007/1-4020-3893-3he nanoscale. The excitation of beats at nanocontacts and the implementation of Heterodyne Force Microscopy (HFM) are described. HFM introduces a very interesting procedure to take advantage of the time resolution inherent in high-frequency actuation.

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Conference proceedings 20061st editionic surface, and how this difference becomes more pronounced towards the end of evaporation. We further show that one-side metal-coated cantilevers, acting as bimetals, allow measuring the average temperature of an evaporating microdrop. Finally, we will discuss two further applications of microdrops

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Environmental Security and Public Safetyhe art. We discuss the basic physical principles involved and show how they can be used to make informed choices about experimental parameters and operating conditions. Experimental data and the results of theoretical models are provided as specific examples of the abstract concepts. Ideas for futur

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Z. TATASHIDZE,I. BONDYREV,E. TSERETELIurves collected for polymers does not lead to a correct evaluation of Young’s modulus. The high slope of the unloading curves is not linked to an elastic behavior, as would be expected, but rather to a viscoelastic effect. This can be argued on the basis that the unloading curves are superimposed on