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Titlebook: Algorithms -- ESA 2004; 12th Annual European Susanne Albers,Tomasz Radzik Conference proceedings 2004 Springer-Verlag Berlin Heidelberg 200

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https://doi.org/10.1007/978-3-476-02902-7er of triconnected components and the number of cutvertices are small, the problem can be solved relatively quickly, even for a large number of vertices. This is the first parameterized algorithm for upward planarity testing.
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A Parameterized Algorithm for Upward Planarity Testinger of triconnected components and the number of cutvertices are small, the problem can be solved relatively quickly, even for a large number of vertices. This is the first parameterized algorithm for upward planarity testing.
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https://doi.org/10.1007/978-3-7091-3743-7uming. Therefore, the laboratory process of finishing is modeled as an optimization problem aimed at minimizing laboratory cost. We give an algorithm that solves this problem optimally and runs in worst case . time.
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https://doi.org/10.1007/978-3-7091-3743-7es of the perfect matching polytope .(.) = {. ∈ ℝ. | . = .,  . ≥ 0}, where . is the incidence matrix of .. We also give similar generation algorithms for other related problems, including .-factors in bipartite graphs, and perfect 2-matchings in general graphs.
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