Titlebook: Advances in Scanning Probe Microscopy; Toshio Sakurai,Yousuke Watanabe Book 2000 Springer-Verlag Berlin Heidelberg 2000 AFM.Adsorption.Exp

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Advances in Scanning Probe Microscopy978-3-642-56949-4Series ISSN 1435-1889

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Mohammad A. Rajabi,J. A. Rod BlaisIn this paper, after a brief review of the mesoscopic (local) work function, we present our recent studies using Scanning Tunneling Microscopy. We discuss the thickness dependence of the work function for Au/Cu(111) and Pd/Cu(111), the potential profile on Au(111) and Cu(111) steps, and the work function on reconstructed S/Pt (111).

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Mesoscopic Work Function Measurement by Scanning Tunneling Microscopy,In this paper, after a brief review of the mesoscopic (local) work function, we present our recent studies using Scanning Tunneling Microscopy. We discuss the thickness dependence of the work function for Au/Cu(111) and Pd/Cu(111), the potential profile on Au(111) and Cu(111) steps, and the work function on reconstructed S/Pt (111).

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https://doi.org/10.1007/978-3-642-56949-4AFM; Adsorption; Experiment; Fulleren; Fullerene; REM; STM

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Maria Rosaria Sessa,Francesco Sicaond (DB) structures. Electronic structures of DB wires are studied using STS. The wires composed of both unpaired DBs and paired DBs show a finite density of states at the Fermi level and do not show semiconductive band gaps. The results agree well with first-principles theoretical calculations. The

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A Resilient Web Caching Architectureted in the early days of STM. However, in recent experiments, barrier-height imaging has been revived to procure unique information which cannot be obtained by other imaging methods. In these experiments, the sensitivity of the barrier height to the sample work function has been utilized for element

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Book 2000s book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re­ search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their a