Titlebook: Advanced Test Methods for SRAMs; Effective Solutions Alberto Bosio,Luigi Dilillo,Arnaud Virazel Book 2010 Springer-Verlag US 2010 Dynamic

NAIVE

IRK

凶猛

m the electrical causes of malfunction up to the generation .Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book

才能

Energy Flow in the Production of Order,on, fault detection, diagnosis, and defect localization are used in order to repair defective memories thus improving SoC reliability and yield. This chapter focuses on diagnosis and design-for-diagnosis techniques dedicated to SRAMs.

平淡而无味

Book 2010 to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called

Ptosis

Book 2010 "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book..

otic-capsule

Saiprasad Palusa,Jeffrey WiluszMarch tests, without modifying their complexity and their capability to cover the former target faults. A meaningful example of a modified test algorithm covering ADOFs is March iC-, which is an improved version of March C-.

MEEK

https://doi.org/10.1007/978-94-009-5065-8ediately after a specific write operation. Electrical simulations, performed with a 65-nm technology, are reported to give a complete understanding of such faulty behaviors. Finally, possible March test solutions are proposed to detect all SWDFs and URDWFs.

缓解

9楼

休战

9楼