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Titlebook: Advanced Scanning Electron Microscopy and X-Ray Microanalysis; Dale E. Newbury,David C. Joy,Joseph I. Goldstein Book 1986 Springer Science

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期刊全称Advanced Scanning Electron Microscopy and X-Ray Microanalysis
影响因子2023Dale E. Newbury,David C. Joy,Joseph I. Goldstein
视频videohttp://file.papertrans.cn/147/146197/146197.mp4
图书封面Titlebook: Advanced Scanning Electron Microscopy and X-Ray Microanalysis;  Dale E. Newbury,David C. Joy,Joseph I. Goldstein Book 1986 Springer Science
影响因子This book has its origins in the intensive short courses on scanning elec­ tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con­ tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro­ ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan­ ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol­ ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol­ ume, including those on magnetic contrast and electron channeling con­ trast, had to be dropped for reasons of space. Moreover, these topics had naturally
Pindex Book 1986
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https://doi.org/10.1007/978-3-642-27175-5d here will apply to biological and organic samples, for it is with these samples that the problems are most exacting. As well as providing an updated guide to the general problems of specimen preparation, emphasis will be placed on the techniques which permit an analysis of the chemical properties of specimens.
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nually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con­ tinued to evolve
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Electron Channeling Contrast in the SEM,abgedruckten Werke erschienen in Wien in der Zeit von 1904 bis 1924. Mitunter befaBten sich Vertreter der "Reinen Rechtslehre" kritisch ablehnend mit WURZELS Gedanken. 1m allgemeinen blieb sein Werk weit­ gehend unbeachtet. Vor aHem die formal-normativ denkenden osterreichi­ schen Rechtspositivisten
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Computer-Aided Imaging and Interpretation,procedure.Contributions from eminent surgeons, both nationalThis book offers a comprehensive review of reconstructive microsurgery with an emphasis on the recipient vasculature. Chapters describe the anatomy, exposure, and technical considerations of recipient vessels in reconstructive microsurgery.
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Specimen Coating,m of equations, the latter so-called since it leads to the Lorentz reciprocity theorem. The (formally) adjoint Maxwell system is shown to play an essential role in the derivation of scattering theorems. With the aid of the adjoint wave fields in anisotropic and possibly absorbing media, one obtains
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