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Titlebook: Acoustic Scanning Probe Microscopy; Francesco Marinello,Daniele Passeri,Enrico Savio Book 2013 Springer-Verlag Berlin Heidelberg 2013 AFAM

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Hiroshi Saruwatari,Ryoichi Miyazakis chapter, we opted to use a one-dimensional (1D) FEM model for the cantilever beam, which permits to treat the exact vibration of the beam in the contact mode, regardless of its shape (rectangular as well as triangular beams) and excitation mode (by the beam holder, by the sample, by a localized, o
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https://doi.org/10.1007/BFb0054977niques to obtain quantitative values of local elastic constants, and non-linear AFAM. Analytical and finite element models describing transverse flexural vibrations of AFM cantilevers with and without tip-surface contact are recapitulated. The models are suitable for micro fabricated silicon cantile
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Recognizing high-level document structure,for the efficient indentation and high mechanical compliance that brings force sensitivity. Somewhat inventively, UFM allows to combine these two virtues in the same cantilever by using indention of the sample at high frequency, when cantilever is very rigid, but detecting the result of this indenti
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https://doi.org/10.1007/BFb0054977 well as the mechanical properties mapping at nanoscale. As in most techniques developed for local stiffness imaging based on so-called contact mode, the force applied to the surface exceeds acceptable level often causing damage to the sample. On the other hand, the most popular measurement techniqu
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