找回密码
 To register

QQ登录

只需一步,快速开始

扫一扫,访问微社区

SCIE期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT 2024/2025影响因子:5.631 (IEEE T INSTRUM MEAS) (0018-9456). (INST

[复制链接]
查看: 37026|回复: 35
发表于 2025-3-21 16:13:01 | 显示全部楼层 |阅读模式
期刊全称IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
期刊简称IEEE T INSTRUM MEAS
影响因子20245.631
视频video
ISSN0018-9456
eISSN1557-9662
出版商IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
发行地址445 HOES LANE, PISCATAWAY, USA, NJ, 08855-4141
学科分类1.Science Citation Index Expanded (SCIE)--Engineering, Electrical & Electronic | Instruments & Instrumentation; 2.Current Contents Engineering, Computing & Technology--Instrumentation & Measurement; 3.Essential Science Indicators--Engineering;
出版语言English
The information of publication is updating

SCIE(SCI)期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT(20 21 REV HIST)影响因子


SCIE(SCI)期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT(IEEE T INSTRUM MEAS)影响因子@(仪器与仪器)学科排名


SCIE(SCI)期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT(20 21 REV HIST)总引论文


SCIE(SCI)期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT(IEEE T INSTRUM MEAS)总引论文@(仪器与仪器)学科排名


SCIE(SCI)期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT(20 21 REV HIST)影响因子


SCIE(SCI)期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT(IEEE T INSTRUM MEAS)总引频次@(仪器与仪器)学科排名


SCIE(SCI)期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT(20 21 REV HIST)即时影响因子


SCIE(SCI)期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT(IEEE T INSTRUM MEAS)即时影响因子@(仪器与仪器)学科排名


SCIE(SCI)期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT(20 21 REV HIST)五年累积影响因子


SCIE(SCI)期刊IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT(IEEE T INSTRUM MEAS)五年累积影响因子@(仪器与仪器)学科排名


单选投票, 共有 0 人参与投票
 

0票 0%

Perfect with Aesthetics

 

0票 0%

Better Implies Difficulty

 

0票 0%

Good and Satisfactory

 

0票 0%

Adverse Performance

 

0票 0%

Disdainful Garbage

您所在的用户组没有投票权限
发表于 2025-3-21 20:57:56 | 显示全部楼层
发表于 2025-3-22 01:46:36 | 显示全部楼层
发表于 2025-3-22 05:48:21 | 显示全部楼层
Submitted on: 16 March 2018. Revised on: 12 June 2018. Accepted on: 10 July 2018. ___________________IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
发表于 2025-3-22 12:20:51 | 显示全部楼层
Submitted on: 14 June 2012. Revised on: 31 August 2012. Accepted on: 15 September 2012. ___________________IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
发表于 2025-3-22 13:27:37 | 显示全部楼层
Submitted on: 22 April 2006. Revised on: 26 June 2006. Accepted on: 08 July 2006. ___________________IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
发表于 2025-3-22 20:18:15 | 显示全部楼层
发表于 2025-3-23 00:43:37 | 显示全部楼层
Submitted on: 15 November 2024. Revised on: 18 December 2024. Accepted on: 13 February 2025. ___________________IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
发表于 2025-3-23 04:29:26 | 显示全部楼层
发表于 2025-3-23 07:42:21 | 显示全部楼层
 关于派博传思  派博传思旗下网站  友情链接
派博传思介绍 公司地理位置 论文服务流程 影响因子官网 SITEMAP 大讲堂 北京大学 Oxford Uni. Harvard Uni.
发展历史沿革 期刊点评 投稿经验总结 SCIENCEGARD IMPACTFACTOR 派博系数 清华大学 Yale Uni. Stanford Uni.
|Archiver|手机版|小黑屋| 派博传思国际 ( 京公网安备110108008328) GMT+8, 2025-4-28 16:36
Copyright © 2001-2015 派博传思   京公网安备110108008328 版权所有 All rights reserved
快速回复 返回顶部 返回列表