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Titlebook: 3D Microelectronic Packaging; From Architectures t Yan Li,Deepak Goyal Book 2021Latest edition The Editor(s) (if applicable) and The Author

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发表于 2025-3-21 20:05:28 | 显示全部楼层 |阅读模式
期刊全称3D Microelectronic Packaging
期刊简称From Architectures t
影响因子2023Yan Li,Deepak Goyal
视频video
发行地址Provides comprehensive coverage of 3D microelectronic packages.Explains the fundamentals of using solder interconnects as micro-bumps.Demonstrates the advanced materials and processes used in 3D micro
学科分类Springer Series in Advanced Microelectronics
图书封面Titlebook: 3D Microelectronic Packaging; From Architectures t Yan Li,Deepak Goyal Book 2021Latest edition The Editor(s) (if applicable) and The Author
影响因子.This book offers a comprehensive reference guide for graduate students and professionals in both academia and industry, covering the fundamentals, architecture, processing details, and applications of 3D microelectronic packaging. It provides readers an in-depth understanding of the latest research and development findings regarding this key industry trend, including TSV, die processing, micro-bumps for LMI and MMI, direct bonding and advanced materials, as well as quality, reliability, fault isolation, and failure analysis for 3D microelectronic packages. Images, tables, and didactic schematics are used to illustrate and elaborate on the concepts discussed. Readers will gain a general grasp of 3D packaging, quality and reliability concerns, and common causes of failure, and will be introduced to developing areas and remaining gaps in 3D packaging that can help inspire future research and development.  .
Pindex Book 2021Latest edition
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978-981-15-7092-6The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Singapor
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Penglei Ji,Hanchao Li,Luyan Jiang,Xinguo Liu-thin, ultra-light, and high performance with low power consumption. It also opens up a new dimension for the semiconductor industry to maintain Moore’s law with a much lower cost. Motivations as well as various architectures of 3D packaging are illustrated. Challenges in 3D packaging, including fab
发表于 2025-3-22 18:40:11 | 显示全部楼层
Yijing Chen,Chuhua Xian,Shuo Jin,Guiqing Li product architects, why it has generated broad industry attention, and why it is seeing increased adoption in recent years (. [.; . [.]; Ingerly et al., IEDM [.]; Elsherbini et al., IEDM .]). The primary focus of this chapter is on 3D architectures that use .hrough .ilicon .ias (TSVs). The key elem
发表于 2025-3-23 00:17:14 | 显示全部楼层
Lecture Notes in Computer Science high aspect ratio trenches in Si, followed by placement of dielectric, barrier and seed layers, TSV filling and polishing, and then assembly with other components of a device. In addition, planarization, die-thinning and flow processes to fabricate TSV-enabled 3-D architectured microelectronic pack
发表于 2025-3-23 04:58:36 | 显示全部楼层
Yijing Chen,Chuhua Xian,Shuo Jin,Guiqing Lie reliability issues presented by TSVs are linked to manufacturing processes and the resultant microstructure formed. Routine finite-element based reliability studies that treat the TSV filler as an isotropic and homogeneous material are not capable of providing a sufficiently thorough explanation o
发表于 2025-3-23 08:42:03 | 显示全部楼层
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