Titlebook: Verification by Error Modeling; Using Testing Techni Katarzyna Radecka,Zeljko Zilic Book 2003 Springer Science+Business Media Dordrecht 200

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Ondines-curse

Boolean Function Representations,h as truth tables and Boolean equations. Then, through Shannon expansions we present decision diagrams, including word-level decision diagrams (WLDDs). We conclude the chapter with spectral methods, which play a fundamental role in our verification method. Among others, we introduce Arithmetic Trans

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,Don’t Cares and Their Calculation,onditions, together with the exact and approximate ways of their identification. The material discussed here bears a particular importance, as the presented methods for recognizing don’t cares will be applied in a key step of identifying redundant design errors.

万神殿

Testing,lated areas. This is certainly a case when it comes to synthesis, testing and verification. In chapters to follow, we will show how don’t care calculations are successfully used in creating fault list for simulation-based netlist verification. In this chapter, however, we will introduce basics of te

Iniquitous

nitric-oxide

Design Verification by At,mprehensive explicit model of design errors, we propose an implicit fault model, which is based on the Arithmetic Transform (AT) spectral representation of faults. The verification of circuits under the assumption of small errors in spectral domain is then performed by the Universal Test Set (UTS) a

光滑

Identifying Redundant Gate and Wire Replacements, everpresent redundant faults. This chapter considers redundant gate and wire replacement faults identification in verification of gate-level designs. Removing redundant faults from a fault list is critical to the quality and speed of verification schemes. We present the exact identification of redu

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Book 2003mplicated pipelined structures, etc., are now in high demand. For example, Intel Itanium II processor contains more than 200 million transistors, including a 3 MB third level cache. A billion transistor IC was said to be “imminently doable” by Intel fellow J. Crawford at Microprocessor Forum in Octo

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混合物

Identifying Redundant Gate and Wire Replacements,tical to the latter is the novel application of don’t care approximations that identify many redundant faults and quickly point out those that can be detected by methods for stuck-at value faults. A test generation scheme that uses the errorcorrecting properties of AT, discussed in Chapter 6 is incorporated into the overall verification procedure.