Titlebook: Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies; Michael Fulde Book 2010 Springer Science+

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1437-0387 assessment in multi-gate CMOS.Close link to device and tech.Since scaling of CMOS is reaching the nanometer area serious limitations enforce the introduction of novel materials, device architectures and device concepts. Multi-gate devices employing high-k gate dielectrics are considered as promisin

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Analog Properties of Multi-Gate MOSFETs, impact of high-k dielectrics is also covered. The objective is to close the link from technology and integration aspects to analog device performance. The associated trade-offs are outlined. On device level, the reduction of short channel effects is a major advantage of fully depleted multi-gate de

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Multi-Gate Tunneling FETs,look to analog design aspects beyond CMOS. Analog design considerations are derived from basic device performance, temperature and matching behavior. Although multi-gate tunneling FETs (MuGTFETs) feature low on-currents, promising analog properties and low variability regarding temperature and thres

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Book 2010 concepts. Multi-gate devices employing high-k gate dielectrics are considered as promising solution overcoming these scaling limitations of conventional planar bulk CMOS. Variation Aware Analog and Mixed-Signal Circuit Design in Emerging Multi-Gate CMOS Technologies provides a technology oriented a

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1437-0387 ulti-Gate CMOS Technologies provides a technology oriented assessment of analog and mixed-signal circuits in emerging high-k and multi-gate CMOS technologies..978-94-007-3083-0978-90-481-3280-5Series ISSN 1437-0387 Series E-ISSN 2197-6643

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Analog Properties of Multi-Gate MOSFETs,vices, resulting in beneficial output impedance, gain and matching behavior. Serious concerns related to high-k dielectrics are pronounced flicker noise and dynamic threshold voltage variations or hysteresis effects. A novel model of this new hysteresis effects suitable for analog circuit simulation is derived and verified with measurements.