Titlebook: VLSI Technology; Fundamentals and App Yasuo Tarui Book 1986 Springer-Verlag Berlin Heidelberg 1986 LSI.VLSI.circuit.development.integrated

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书目名称VLSI Technology影响因子(影响力)




书目名称VLSI Technology影响因子(影响力)学科排名




书目名称VLSI Technology网络公开度




书目名称VLSI Technology网络公开度学科排名




书目名称VLSI Technology被引频次




书目名称VLSI Technology被引频次学科排名




书目名称VLSI Technology年度引用




书目名称VLSI Technology年度引用学科排名




书目名称VLSI Technology读者反馈




书目名称VLSI Technology读者反馈学科排名

Obituary

VLSI Technology978-3-642-69192-8Series ISSN 0172-5734

会议

招人嫉妒

intolerance

https://doi.org/10.1007/978-3-642-69192-8LSI; VLSI; circuit; development; integrated circuit; semiconductor; transistor

HEED

放纵

remission

Fundamentals of Test and Evaluation,With increasing integration level and circuit complexity toward VLSI, an advanced high technology is required in every part of the production of integrated circuits. Consequently, concerning test and evaluation technology there are several new problems, and it is required to establish new basic technologies for VLSI-testing.

Malleable

Basic Device Technology,One of the most important features of VLSI technique, especially in view of VLSI devices, is the change from the conventional integration of circuits (Integrated Circuit: IC) to the integration of systems itself (Integrated System: IS) as the result of an increased level of integration.

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