书目名称 | VLSI Design and Test |
副标题 | 21st International S |
编辑 | Brajesh Kumar Kaushik,Sudeb Dasgupta,Virendra Sing |
视频video | |
概述 | Includes supplementary material: |
丛书名称 | Communications in Computer and Information Science |
图书封面 |  |
描述 | .This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017.. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions. The papers were organized in topical sections named: digital design; analog/mixed signal; VLSI testing; devices and technology; VLSI architectures; emerging technologies and memory; system design; low power design and test; RF circuits; architecture and CAD; and design verification.. |
出版日期 | Conference proceedings 2017 |
关键词 | Analog/Mixed Signal; Architecture and CAD; Circuits; Design Verification; Devices and Technology – I; Dev |
版次 | 1 |
doi | https://doi.org/10.1007/978-981-10-7470-7 |
isbn_softcover | 978-981-10-7469-1 |
isbn_ebook | 978-981-10-7470-7Series ISSN 1865-0929 Series E-ISSN 1865-0937 |
issn_series | 1865-0929 |
copyright | Springer Nature Singapore Pte Ltd. 2017 |