| 书目名称 | Transmission Electron Microscopy and Diffractometry of Materials | | 编辑 | Brent Fultz,James Howe | | 视频video | | | 概述 | New edition of successful, well-reviewed textbook.Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry.Shows how wave radiation probes the structure of material | | 丛书名称 | Graduate Texts in Physics | | 图书封面 |  | | 描述 | This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. | | 出版日期 | Textbook 2013Latest edition | | 关键词 | Characterization of Materials; Dark-Field and Bright-Field Imaging; Diffraction and Imaging; Diffractio | | 版次 | 4 | | doi | https://doi.org/10.1007/978-3-642-29761-8 | | isbn_softcover | 978-3-642-43315-3 | | isbn_ebook | 978-3-642-29761-8Series ISSN 1868-4513 Series E-ISSN 1868-4521 | | issn_series | 1868-4513 | | copyright | Springer-Verlag Berlin Heidelberg 2013 |
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发表于 2025-3-21 16:29:58
