| 书目名称 | Transmission Electron Microscopy and Diffractometry of Materials | | 编辑 | Brent Fultz,James M. Howe | | 视频video | | | 概述 | Successful and highly acclaimed text.Designed to meet the needs of materials scientists, including students, teachers and researchers.Can be used as both an introductory and advanced level graduate te | | 图书封面 |  | | 描述 | .This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. ...``I can warmly recommend this book, which is attractively priced, as an excellent addition for any materials sc | | 出版日期 | Textbook 20083rd edition | | 关键词 | Crystallography; PES; REM; STEM; crystal; diffraction; electron diffraction; electron microscopy; microscopy | | 版次 | 3 | | doi | https://doi.org/10.1007/978-3-540-73886-2 | | isbn_ebook | 978-3-540-73886-2 | | copyright | Springer-Verlag Berlin Heidelberg 2008 |
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发表于 2025-3-21 18:43:01
