| 书目名称 | Transmission Electron Microscopy | | 副标题 | A Textbook for Mater | | 编辑 | David B. Williams,C. Barry Carter | | 视频video | | | 图书封面 |  | | 描述 | Electron microscopy has revolutionized our understanding the extraordinary intellectual demands required of the mi of materials by completing the processing-structure-prop croscopist in order to do the job properly: crystallography, erties links down to atomistic levels. It now is even possible diffraction, image contrast, inelastic scattering events, and to tailor the microstructure (and meso structure ) of materials spectroscopy. Remember, these used to be fields in them to achieve specific sets of properties; the extraordinary abili selves. Today, one has to understand the fundamentals ties of modem transmission electron microscopy-TEM of all of these areas before one can hope to tackle signifi instruments to provide almost all of the structural, phase, cant problems in materials science. TEM is a technique of and crystallographic data allow us to accomplish this feat. characterizing materials down to the atomic limits. It must Therefore, it is obvious that any curriculum in modem mate be used with care and attention, in many cases involving rials education must include suitable courses in electron mi teams of experts from different venues. The fundamentals croscopy. It | | 出版日期 | Textbook 19961st edition | | 关键词 | Helium-Atom-Streuung; crystal; diffraction; electron microscope; electron microscopy; materials character | | 版次 | 1 | | doi | https://doi.org/10.1007/978-1-4757-2519-3 | | isbn_ebook | 978-1-4757-2519-3 | | copyright | Springer Science+Business Media New York 1996 |
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发表于 2025-3-21 18:27:30
