| 书目名称 | Test and Diagnosis for Small-Delay Defects |
| 编辑 | Mohammad Tehranipoor,Ke Peng,Krishnendu Chakrabart |
| 视频video | |
| 概述 | Provides an introduction to VLSI testing and diagnosis, with a focus on delay testing and small-delay defects.Presents the most effective techniques for screening small-delay defects, such as long pat |
| 图书封面 |  |
| 描述 | This book will introduce new techniques for detecting and diagnosing small-delay defects in integrated circuits. Although this sort of timing defect is commonly found in integrated circuits manufactured with nanometer technology, this will be the first book to introduce effective and scalable methodologies for screening and diagnosing small-delay defects, including important parameters such as process variations, crosstalk, and power supply noise. |
| 出版日期 | Book 2012 |
| 关键词 | Chip Testing; Delay Testing; Design for Test; Integrated Circuits and Systems; Nanometer Circuit Testing |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-1-4419-8297-1 |
| isbn_softcover | 978-1-4899-8952-9 |
| isbn_ebook | 978-1-4419-8297-1 |
| copyright | Springer Science+Business Media, LLC 2012 |
发表于 2025-3-21 19:21:52
