| 书目名称 | Single-Event Effects, from Space to Accelerator Environments | | 副标题 | Analysis, Prediction | | 编辑 | Ygor Quadros de Aguiar,Frédéric Wrobel,Rubén Garcí | | 视频video | | | 概述 | Describes both the fundamental concepts underlying radiation effects in electronics and state-of-the-art hardening methodologies.Addresses failure mechanisms, known as single-event effects (SEEs), and | | 图书封面 |  | | 描述 | .This book describes the fundamental concepts underlying radiation-induced failure mechanisms in electronic components operating in harsh environments, such as in space missions or in particle accelerators. In addition to providing an extensive overview of the dynamics and composition of different radiation environments, the authors discuss the failure mechanisms, known as single-event effects (SEEs), and dedicated failure modeling and prediction methodologies. Additionally, novel radiation-hardening-by-design (RHBD) techniques at physical layout and circuit levels are described...Readers who are newcomers to this field will learn the fundamental concepts of particle interaction physics and electronics hardening design, starting from the composition and dynamics of radiation environments and their effects on electronics, to the qualification and hardening of components. Experienced readers will enjoy the comprehensive discussion of the state-of-the-art in modeling, simulation, and analysis of radiation effects developed in the recent years, especially the outcome of the recent European project, RADSAGA... .Describes both the fundamental concepts underlying radiation effects in elec | | 出版日期 | Book‘‘‘‘‘‘‘‘ 2025 | | 关键词 | Soft Errors from Particle to Circuits; Single Event Effects in Aerospace; Radiation Effects on Integra | | 版次 | 1 | | doi | https://doi.org/10.1007/978-3-031-71723-9 | | isbn_softcover | 978-3-031-71725-3 | | isbn_ebook | 978-3-031-71723-9 | | copyright | The Editor(s) (if applicable) and The Author(s) 2025 |
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发表于 2025-3-21 16:37:32
