| 书目名称 | Synthetic Polymeric Membranes |
| 副标题 | Characterization by |
| 编辑 | K. C. Khulbe,C. Y. Feng,Takeshi Matsuura |
| 视频video | |
| 概述 | First book which combines both fields AFM and Synthetic Membranes.Will provide a very useful guide to the readers who wish to enter the subject of the book.Gives details of AFM experimental methods an |
| 丛书名称 | Springer Laboratory |
| 图书封面 |  |
| 描述 | Tis book concentrates on atomic force microscopy (AFM), a method recently - veloped to study the surfaces of synthetic polymeric membranes. AFM is becoming a very important tool for the characterization of synthetic polymeric membranes. Te development of membranes of improved performance depends on the exact kn- ledge of the morphology of a thin selective layer that exists at the surface of the m- brane. Te control of the morphology of the selective layer is crucial for the design of synthetic polymeric membranes. With a relatively short history of only twen- ?ve years, AFM has ?rmly established its position as a method to characterize the membrane surface. Each chapter of this book includes information on basic principles, commercial applications, current research, and guidelines for future research. Each chapter is summarized at the end and contains a comprehensive list of references. Te introductory chapter gives a brief overview of synthetic polymeric m- branes and their applications both in industrial processes and in biomedical ?elds. It also gives an overview of studies on membrane surface morphology by various methods. Chapter ? deals with the synthesis of membranes, the pr |
| 出版日期 | Book 2008 |
| 关键词 | AFM; Atomic Force Microscopy; Helium-Atom-Streuung; Membranes; PED; Polymer; Polymers; Surfaces; morphology |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-3-540-73994-4 |
| isbn_softcover | 978-3-642-09327-2 |
| isbn_ebook | 978-3-540-73994-4Series ISSN 0945-6074 Series E-ISSN 2196-1174 |
| issn_series | 0945-6074 |
| copyright | Springer-Verlag Berlin Heidelberg 2008 |
发表于 2025-3-21 16:57:59
