| 书目名称 | Strain Effect in Semiconductors |
| 副标题 | Theory and Device Ap |
| 编辑 | Yongke Sun,Scott E. Thompson,Toshikazu Nishida |
| 视频video | http://file.papertrans.cn/879/878612/878612.mp4 |
| 概述 | Provides industry relevant applications for strained CMOS technology.Discusses range of applications from planar (2D) to nano-wire (1D) devices.Treats strain physics at both qualitative overview level |
| 图书封面 |  |
| 描述 | Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. Discusses relevant applications of strain while also focusing on the fundamental physics pertaining to bulk, planar, and scaled nano-devices. Hence, this book is relevant for current strained Si logic technology as well as for understanding the physics and scaling for future strained nano-scale devices. |
| 出版日期 | Book 2010 |
| 关键词 | CMOS technology; Semiconductor; Sensor; fundamental physics; logic devices; microelectromechanical system |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-1-4419-0552-9 |
| isbn_softcover | 978-1-4899-8315-2 |
| isbn_ebook | 978-1-4419-0552-9 |
| copyright | Springer-Verlag US 2010 |
|Archiver|手机版|小黑屋|
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