Titlebook: Single Charge Tunneling; Coulomb Blockade Phe Hermann Grabert,Michel H. Devoret Book 1992 Springer Science+Business Media New York 1992 Cou

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Possible Applications of the Single Charge Tunneling,e situations, this sort of research work is justified (provided that its authors do not depart too far from what Rolf Landauer calls the “truth in advertising” [1]). In fact, operation of many new “devices” involves very complex physics which sometimes can be studied in this way alone.

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Transferring Electrons One By One,eling through several junctions discussed in Chap. 6. From a practical point of view, these devices could lead to metrological applications such as the accurate measurement of the fine structure constant a and the realisation of a current standard. We describe below three devices:

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M. H. Devoret,H. Graberteifschüsse durch den starken Luftdruck (besonders am Kopfe beobachtet als von einem Punkte strahlenförmig ausgehende, mannigfach sich kreuzende Riß wunden), die Giftigkeit und die Rauchentwicklung ihrer Phosphorladimg, während die Sprengstücke ihres Mantels, wenn die Granate dicht vor, über oder hin

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Josephson Effect in Low-Capacitance Tunnel Junctions,lters at microwave frequencies are not simple to achieve, and the extensive and systematic early experiments of the Harvard group were made with essentially direct connection to leads, which presumably acted as transmission lines characterized by characteristic impedances of order . .. These data co

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Single Charges in 2-Dimensional Junction Arrays,n produces a current, and vortices, whose motion produces a voltage. The former dominate in arrays where the charging energy . . exceeds the Josephson coupling . ., the latter in arrays with . . exceeding . .. Moreover, in arrays with low dissipation the vortices can have a very special dynamics [11

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0258-1221 e NATO Scientific A:ffairs Division, Brussels, Belgium. The Centre de Physique des Hauches has provided a superbly situated conference site and took care af man978-1-4757-2168-3978-1-4757-2166-9Series ISSN 0258-1221