Titlebook: Simulation Methods for Reliability and Availability of Complex Systems; Javier Faulin,Angel A. Juan,José-Emmanuel Ramírez- Book 2010 Sprin

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Analysis and Improvements of Path-based Methods for Monte Carlo Reliability Evaluation of Static Modof the whole system is a rare event. We focus on the robustness properties of estimators. We also propose improvements to the original technique, including its combination with randomized quasi-Monte Carlo, for which we prove that the variance converges at a faster rate (asymptotically) than for sta

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Simulation-based Methods for Studying Reliability and Preventive Maintenance of Public Infrastructuro emergency response and prevention that can be estimated and improved upon via discrete-event simulation. We will describe two problem domains in which measurement of these metrics is critical for optimal decision-making. We believe that there is a great deal of interest currently, within both the

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Power Distribution System Reliability Evaluation Using Both Analytical Reliability Network Equivalen simulation technique evaluates the reliability indices by a series of trials and therefore the procedure is more complicated and requires longer computer time. The simulation approach can provide both the average values and probability distributions of the load point and system indices. It may be p

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Potential Applications of Discrete-event Simulation and Fuzzy Rule-based Systems to Structural Reliay information can be inferred. Two numerical examples illustrate some potential applications of the proposed methodology to achieving more reliable and structural designs. Finally, an alternative approach to model uncertainty at component level is also introduced as ongoing work. This new approach i

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1614-7839 ty of Complex Systems is designed to support managers and system engineers in the improvement of R and A, as well as providing a thorough exploration of the techniques and algorithms available for researchers, and for advanced undergraduate and postgraduate students..978-1-4471-2552-5978-1-84882-213-9Series ISSN 1614-7839 Series E-ISSN 2196-999X