Titlebook: Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Ma; Proceedings of the N Paula Maria Vila

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书目名称Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Ma影响因子(影响力)




书目名称Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Ma影响因子(影响力)学科排名




书目名称Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Ma网络公开度




书目名称Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Ma网络公开度学科排名




书目名称Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Ma被引频次




书目名称Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Ma被引频次学科排名




书目名称Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Ma年度引用




书目名称Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Ma年度引用学科排名




书目名称Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Ma读者反馈




书目名称Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Ma读者反馈学科排名

bronchodilator

Principles of Basic and Advanced Scanning Probe Microscopy, is facilitated by probes of local properties. Recent extensions of scanning probe microscopy that extract electrical potential, capacitance, dielectric constant, electromechanical coupling coefficients and impedance, are described. In most cases, these complex properties are accessed by stimulatio

排他

Nanoscale Probing of Physical and Chemical Functionality with Near-Field Optical Microscopyme resolution and improved spatial confinement. Starting from basic properties of optical waves, this contribution summarises what chemical and physical information may be collected when performing such (near-field) optical experiments resulting in specific and functional properties of the material

RUPT

Nanoscale Electronic Measurements of Semiconductors Using Kelvin Probe Force Microscopyces at the nanometer scale has come to be of outstanding importance..The Kelvin probe force microscopy technique has already been demonstrated as a powerful tool for measuring electrostatic forces and electric potential distribution with nanometer resolution. In this review, we demonstrate several r

Estrogen

Expanding the Capabilities of the Scanning Tunneling Microscopey and to characterize atoms and molecules on surfaces and how it is that the scanning tunneling microscope images these surfaces and adsorbates will be discussed. We have extended the capabilities of scanning probe microscopes in several ways; two in particular will be highlighted. In the first sect

tic-douloureux

Functions of NC-AFM on Atomic Scaletomic resolution microscope but also novel atomic tools based on a mechanical method such as a three-dimensional mapping tool of atomic force between the tip and sample atoms, a discrimination tool of atomic force mechanisms between the tip and sample atoms, a discrimination tool of atom species on

CIS

Abnormal

Nanoinspection of Dielectric and Polarization Properties at Inner and Outer Interfaces in Functionalff force spectroscopy (PFS)] in order to deduce the local dielectric and polarization properties on functional ferroelectric PZT thin films both at outer and inner interfaces with a lateral resolution of better than 50 nm. We show that the polarization profile into the depth of the PZT sample varies

EVEN

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