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Titlebook: Scanning Probe Microscopy in Nanoscience and Nanotechnology 3; Bharat Bhushan Book 2013 Springer-Verlag Berlin Heidelberg 2013 High-speed

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发表于 2025-3-21 19:36:40 | 显示全部楼层 |阅读模式
书目名称Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
编辑Bharat Bhushan
视频video
概述Summarizes the currrent state of the art in scanning probe microscoopy techniques.Contains strong part on biological applications.Contributions by leading researchers and application scientists from a
丛书名称NanoScience and Technology
图书封面Titlebook: Scanning Probe Microscopy in Nanoscience and Nanotechnology 3;  Bharat Bhushan Book 2013 Springer-Verlag Berlin Heidelberg 2013 High-speed
描述This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
出版日期Book 2013
关键词High-speed AFM imaging; SNOM; atomic force microscopy; biological nanocharacterization; biomimetics; over
版次1
doihttps://doi.org/10.1007/978-3-642-25414-7
isbn_softcover978-3-662-50725-4
isbn_ebook978-3-642-25414-7Series ISSN 1434-4904 Series E-ISSN 2197-7127
issn_series 1434-4904
copyrightSpringer-Verlag Berlin Heidelberg 2013
The information of publication is updating

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1434-4904 researchers and application scientists from all over the world and from various industries to provide a broader perspective.978-3-662-50725-4978-3-642-25414-7Series ISSN 1434-4904 Series E-ISSN 2197-7127
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Exploring Mesoscale Contact Mechanics by Atomic Force Microscopys, is certainly mandatory and highly promising. In this chapter, we present atomic force microscopy as an ideal tool for contact mechanics investigations on individual and multiple contact junctions. In particular, we focus on the fabrication of custom probes, with characteristic size from a few hun
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