书目名称 | Scanning Probe Microscopy in Nanoscience and Nanotechnology |
编辑 | Bharat‘Bhushan |
视频video | |
概述 | Scientific reviews on scanning tunneling microscopy and atomic force microscopy.Integrates basic scientific and applicational aspects.With a foreword by the co-inventor of AFM, Christoph Gerber.Useful |
丛书名称 | NanoScience and Technology |
图书封面 |  |
描述 | .This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber. |
出版日期 | Book 2010 |
关键词 | Industrie; Nanomaterial; Sensor; atomic force microscope; biomimetics; biosensor; carbon nanotubes; electro |
版次 | 1 |
doi | https://doi.org/10.1007/978-3-642-03535-7 |
isbn_softcover | 978-3-662-50220-4 |
isbn_ebook | 978-3-642-03535-7Series ISSN 1434-4904 Series E-ISSN 2197-7127 |
issn_series | 1434-4904 |
copyright | Springer-Verlag Berlin Heidelberg 2010 |