书目名称 | Scanning Probe Microscopy | 副标题 | Atomic Scale Enginee | 编辑 | Adam Foster,Werner Hofer | 视频video | | 概述 | Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy.Provides a framework for li | 丛书名称 | NanoScience and Technology | 图书封面 |  | 描述 | .Scanning Probe Microscopy. is a comprehensive source of information for researchers, teachers, and graduate students about the rapidly expanding field of scanning probe theory. Writing in a tutorial style, the authors explain from scratch the theory behind today’s simulation techniques and give examples of theoretical concepts through state-of-the-art simulations, including the means to compare these results with experimental data. The book provides the first comprehensive framework for electron transport theory with its various degrees of approximations, thus allowing extensive insight into the physics of scanning probes. Experimentalists will appreciate how the materials properties influence the instrument‘s operation, and theorists will understand how simulations can be directly compared to experimental data... ..Key Features...Serves as a comprehensive source of information for researchers, teachers, and students about the theory underlying the rapidly expanding field of scanning probe microscopy..Provides a framework for linking scanning probe theory and simulations with experimental data..Written in the style of a textbook with step-by-step examples of how theoretical concep | 出版日期 | Book 2006 | 关键词 | materials properties; microscopy; molecule; simulation; spectroscopy | 版次 | 1 | doi | https://doi.org/10.1007/0-387-37231-8 | isbn_softcover | 978-1-4419-2306-6 | isbn_ebook | 978-0-387-37231-0Series ISSN 1434-4904 Series E-ISSN 2197-7127 | issn_series | 1434-4904 | copyright | Springer-Verlag New York 2006 |
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