| 书目名称 | Scanning Force Microscopy of Polymers | | 编辑 | Holger Schönherr,G. Julius Vancso | | 视频video | | | 概述 | A practice oriented book. It "teaches" the reader to pick up knowledge and skills necessary to obtain good and reliable results within the shortest possible time.Didactically clear and easily understa | | 丛书名称 | Springer Laboratory | | 图书封面 |  | | 描述 | Scope of the Book Synthetic and natural polymers exhibit a complex structural and morphological hierarchy on multiple length scales [1], which determines their performance. Thus, research aiming at visualizing structure and morphology using a multitude of microscopy techniques has received considerable attention since the early days of polymer science and technology. Various well-developed techniques such as optical microscopy and different forms of electron microscopy (Scanning Electron Micr- copy, SEM; Transmission Electron Microscopy, TEM; Environmental Scanning Electron Microscopy, ESEM) allow one to view polymeric structure at different levels of magni?cation. These classical techniques, and their applications to po- mers, are well documented in the literature [2, 3]. The invention of Scanning Tunneling Microscopy (STM) inspired the devel- ment of Atomic Force Microscopy (AFM) and other forms of scanning proximity microscopes in the late 1980s [4, 5]. AFM, unlike STM, can be used to image n- conducting specimens such as polymers. In addition, AFM imaging is feasible in liquids, which has several advantages. Using liquid imaging cells the forces between specimen and AFM probe a | | 出版日期 | Book 2010 | | 关键词 | AFM; Copolymer; Homopolymer; Makromoleküle; Mikroskopie; PET; Polybuten; Polyethylen; Polymer; Polymer Analyt | | 版次 | 1 | | doi | https://doi.org/10.1007/978-3-642-01231-0 | | isbn_softcover | 978-3-662-51749-9 | | isbn_ebook | 978-3-642-01231-0Series ISSN 0945-6074 Series E-ISSN 2196-1174 | | issn_series | 0945-6074 | | copyright | Springer-Verlag Berlin Heidelberg 2010 |
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发表于 2025-3-21 16:48:50
