书目名称 | Reliability Improvement Technology for Power Converters |
编辑 | Kyo-Beum Lee,June-Seok Lee |
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概述 | Presents a new modulation technique of reliability improvement schemes for a three-level converter.Offers valuable information for postgraduate students in electrical engineering, as well as power ele |
丛书名称 | Power Systems |
图书封面 |  |
描述 | .This book describes how to design circuits in power electronics systems using a reliability approach in three-level topologies, which have many advantages in terms of the current total harmonic distortion and efficiency. Such converter types are increasingly used in large power applications and photovoltaics (PV), therefore research on improvements in the reliability of such systems using multi-level topologies has become important. Four studies for reliability improvement are contained in this book: an open-circuited switch fault detection scheme, tolerance control for an open-circuited switch fault, neutral-point voltage ripple reduction, and leakage current reduction. This book treats not only the topology, but also the fault tolerance and the reduction of the ripples and leakage. This book is aimed at advanced students of electrical engineering and power electronics specialists.. . |
出版日期 | Book 2017 |
关键词 | Multi-level topologies; Open-circuited switch fault detection; Tolerant control for an open-circuited |
版次 | 1 |
doi | https://doi.org/10.1007/978-981-10-4992-7 |
isbn_softcover | 978-981-13-5287-4 |
isbn_ebook | 978-981-10-4992-7Series ISSN 1612-1287 Series E-ISSN 1860-4676 |
issn_series | 1612-1287 |
copyright | Springer Nature Singapore Pte Ltd. 2017 |