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Titlebook: Radio Recombination Lines; Their Physics and As M.A. Gordon,R.L. Sorochenko Book 2009 Springer-Verlag New York 2009 Mark Gordon.RRL observa

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发表于 2025-3-21 16:04:53 | 显示全部楼层 |阅读模式
书目名称Radio Recombination Lines
副标题Their Physics and As
编辑M.A. Gordon,R.L. Sorochenko
视频video
丛书名称Astrophysics and Space Science Library
图书封面Titlebook: Radio Recombination Lines; Their Physics and As M.A. Gordon,R.L. Sorochenko Book 2009 Springer-Verlag New York 2009 Mark Gordon.RRL observa
描述.Radio Recombination Lines. is a comprehensive guide to the physics and observations of Radio Recombination Lines from astronomical sources. It includes the history of RRL detections, the astrophysics underlying their intensities and line shapes including topics like departures from LTE and Stark broadening, the maximum possible size of an atom, as well as detailed descriptions of the astronomical topics for which RRLs have proved to be effective tools. In addition, the appendix includes detailed physics underlying the Bohr atomic model, tables of RRL frequencies including fine structure components, techniques for calculating hydrogenic oscillator strengths, and formulas for converting telescope intensity units to astrophysical ones....Radio Recombination Lines. is written for astronomers and physicists. It is also suitable as a graduate-level textbook.  This softcover contains updates and corrections from the previous hardcover published in 2002..."We now have a splendid book written by two of the pioneers, M.A. Gordon of the National Radio Astronomy Observatory in Tucson and R.L. Sorochenko of the Lebedev Institute. In their Preface the authors say that the book was written by ex
出版日期Book 2009
关键词Mark Gordon; RRL observations and theory; Radio Recombination Lines explained; Roman Sorochenko; astrono
版次1
doihttps://doi.org/10.1007/978-0-387-09691-9
isbn_softcover978-0-387-09604-9
isbn_ebook978-0-387-09691-9Series ISSN 0067-0057 Series E-ISSN 2214-7985
issn_series 0067-0057
copyrightSpringer-Verlag New York 2009
The information of publication is updating

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M.A. Gordon,R.L. Sorochenkots of reliability and SEU.Covers different aspects of power,With the semiconductor market growth, new Integrated Circuit designs are pushing the limit of the technology and in some cases, require specific fine-tuning of certain process modules in manufacturing. Thus the communities of design and tec
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M.A. Gordon,R.L. Sorochenkoed by the Open Research Society, NGO, http://www.open-knowledge-society.org, and took place in the American College of Greece, http://www.acg.gr, during September 24–27, 2008, in Athens, Greece. The World Summit on the Knowledge Society Series is an international attempt to promote a dialogue on the
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978-0-387-09604-9Springer-Verlag New York 2009
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