| 书目名称 | Predictive Technology Model for Robust Nanoelectronic Design |
| 编辑 | Yu Cao |
| 视频video | http://file.papertrans.cn/755/754611/754611.mp4 |
| 概述 | Provides a systematic treatment of predictive modeling and design prototyping, from the fundamental concept to practical benchmarks.Includes a complete and quantitative vision on the opportunities and |
| 丛书名称 | Integrated Circuits and Systems |
| 图书封面 |  |
| 描述 | Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling. |
| 出版日期 | Book 2011 |
| 关键词 | Circuit performance analysis; Device and circuit reliability; Device modeling; Electronic design automa |
| 版次 | 1 |
| doi | https://doi.org/10.1007/978-1-4614-0445-3 |
| isbn_softcover | 978-1-4614-3021-6 |
| isbn_ebook | 978-1-4614-0445-3Series ISSN 1558-9412 Series E-ISSN 1558-9420 |
| issn_series | 1558-9412 |
| copyright | Springer Science+Business Media, LLC 2011 |
|Archiver|手机版|小黑屋|
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