| 书目名称 | Positron Profilometry | | 副标题 | Probing Material Dep | | 编辑 | Jerzy Dryzek | | 视频video | | | 概述 | Features comprehensive coverage of positron profilometry, unraveling defect depth distribution in various materials.Gives an in-depth analysis of positron annihilation techniques and different implant | | 丛书名称 | SpringerBriefs in Materials | | 图书封面 |  | | 描述 | This book provides a comprehensive overview of positron profilometry, specifically focusing on the analysis of defect depth distribution in materials. Positron profilometry plays a crucial role in understanding and characterizing defects in a wide range of materials, including metals, semiconductors, polymers, and ceramics. By analyzing the depth distribution of defects, researchers can gain insights into various material properties, such as crystal structure, defect density, and diffusion behavior. The author‘s extensive research spanning a period of two decades has primarily centered on subsurface zones. These regions, located beneath the surface and subjected to various surface processes, play a crucial role in generating defect distributions. Three experimental techniques and their data analysis are described in detail: a variable-energy positron beam (VEP) called sometimes a slow positron beam, a technique called implantation profile depth scanning (DSIP), and a sequential etching(SET) technique. The usability of these techniques is illustrated by many examples of measurements by the author and others. | | 出版日期 | Book 2023 | | 关键词 | Defects Depth Distribution; Positron Annihilation Spectroscopy; Energetic Positrons in Matter; Material | | 版次 | 1 | | doi | https://doi.org/10.1007/978-3-031-41093-2 | | isbn_softcover | 978-3-031-41092-5 | | isbn_ebook | 978-3-031-41093-2Series ISSN 2192-1091 Series E-ISSN 2192-1105 | | issn_series | 2192-1091 | | copyright | The Editor(s) (if applicable) and The Author(s), under exclusive license to Springer Nature Switzerl |
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发表于 2025-3-21 18:27:37
