| 书目名称 | Physical Limitations of Semiconductor Devices | | 编辑 | V. A. Vashchenko,V. F. Sinkevitch | | 视频video | | | 概述 | Provides the description and translation of cross-disciplinary phenomena for reliability assurance including circuit design, ESD design and TCAD simulation.Applies directly to the area of ESD protecti | | 图书封面 |  | | 描述 | Since the beginning of semiconductor era in microelectronics the methodology of reliability assessment became a well established area. In most cases the reliability assessment involves statistical methods for safe operating area and long term re- ability parameters at the development of semiconductor processes, components and systems. At the same time in case of catastrophic failures at any development phase the major practical method is failure analysis (FA). However FA is mainly dealing with detection of consequences of some irreversible event that already happened. This book is focused on the most important and the less summarized reliability aspects. Among them: catastrophic failures, impact of local structural inhomo- neities, major principles of physical limitation of safe-operating area (SOA), physical mechanisms of the current instability, filamentation and conductivity modulation in particular device types and architectures. Specifically, the similar principles and regularities are discussed for elect- static discharge (ESD) protection devices, treating them as a particular case of pulsed power devices. Thus both the most intriguing applications and reliability problems in | | 出版日期 | Book 2008 | | 关键词 | ESD; Leistungsfeldeffekttransistor; SOA; Sinkevitch; Transistor; Vashchenko; bipolar junction transistor; b | | 版次 | 1 | | doi | https://doi.org/10.1007/978-0-387-74514-5 | | isbn_softcover | 978-1-4419-4505-1 | | isbn_ebook | 978-0-387-74514-5 | | copyright | Springer-Verlag US 2008 |
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发表于 2025-3-21 19:36:02
