| 书目名称 | Photo-Excited Charge Collection Spectroscopy | | 副标题 | Probing the traps in | | 编辑 | Seongil Im,Youn-Gyoung Chang,Jae Hoon Kim | | 视频video | | | 概述 | New and easy method to quantitatively measure the trap density of state in FETs as a measure of device instability are included.New and easy method to characterize the electronic structure of organic | | 丛书名称 | SpringerBriefs in Physics | | 图书封面 |  | | 描述 | .Solid state field-effect devices such as organic and inorganic-channel thin-film transistors (TFTs) have been expected to promote advances in display and sensor electronics. The operational stabilities of such TFTs are thus important, strongly depending on the nature and density of charge traps present at the channel/dielectric interface or in the thin-film channel itself. .This book contains how to characterize these traps, starting from the device physics of field-effect transistor (FET). Unlike conventional analysis techniques which are away from well-resolving spectral results, newly-introduced photo-excited charge-collection spectroscopy (PECCS) utilizes the photo-induced threshold voltage response from any type of working transistor devices with organic-, inorganic-, and even nano-channels, directly probing on the traps. So, our technique PECCS has been discussed through more than ten refereed-journal papers in the fields of device electronics, applied physics, applied chemistry, nano-devices and materials science, finally finding a need to be summarized with several chapters in a short book. Device physics and instrumentations of PECCS are well addressed respectively, in th | | 出版日期 | Book 2013 | | 关键词 | Deep-level transient Spectroscopy; Field-effect Transistors (FETs); Nanowire-based FETs; Organic field- | | 版次 | 1 | | doi | https://doi.org/10.1007/978-94-007-6392-0 | | isbn_softcover | 978-94-007-6391-3 | | isbn_ebook | 978-94-007-6392-0Series ISSN 2191-5423 Series E-ISSN 2191-5431 | | issn_series | 2191-5423 | | copyright | The Author(s) 2013 |
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发表于 2025-3-21 17:43:57
