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Titlebook: On-line Error Detection and Fast Recover Techniques for Dependable Embedded Processors; Matthias Pflanz Book 2002 Springer-Verlag Berlin H

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Matthias Pflanznufacturing companies and design engineers are constantly trying to improve the performances of pumps by designing more ef cient pumps and by using the latest technologies available in terms of design software, new developed materials, and state of the art manufacturing tools. Today, computational u
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2. Fault Models and Fault-Behavior of Processor Structures,nductor) transistor circuits, the silicon oxide is used as an insulation material and as the gate oxide. Therefore, . are a common reason for transistor failures. If the gate oxide is too thin, for instance, the transistor is susceptible to permanent gate damage by voltage peaks. Also, material poll
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On-line Error Detection and Fast Recover Techniques for Dependable Embedded Processors
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