书目名称 | On-Chip Current Sensors for Reliable, Secure, and Low-Power Integrated Circuits | 编辑 | Rodrigo Possamai Bastos,Frank Sill Torres | 视频video | | 概述 | Presents a unique approach for detection of radiation-induced transient faults in integrated circuits.Describes the effects of ionizing particles in the transistor body and discusses its exploitation. | 图书封面 |  | 描述 | .This book provides readers with insight into an alternative approach for enhancing the reliability, security, and low power features of integrated circuit designs, related to transient faults, hardware Trojans, and power consumption. The authors explain how the addition of integrated sensors enables the detection of ionizing particles and how this information can be processed at a high layer. The discussion also includes a variety of applications, such as the detection of hardware Trojans and fault attacks, and how sensors can operate to provide different body bias levels and reduce power costs. Readers can benefit from these sensors-based approaches through designs with fast response time, non-intrusive integration on gate-level and reasonable design costs. . | 出版日期 | Book 2020 | 关键词 | Soft errors; Fault-tolerant systems; Dependable embedded processors; Radiation-Induced Transient Faults | 版次 | 1 | doi | https://doi.org/10.1007/978-3-030-29353-6 | isbn_softcover | 978-3-030-29355-0 | isbn_ebook | 978-3-030-29353-6 | copyright | Springer Nature Switzerland AG 2020 |
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